El-Mul
Analytical Electron Microscopy Detectors

Analytical Electron Microscopy Detectors

From traditional Everhart-Thornley detectors, through a selection of solid-state detectors and culminating with complex in-column, energy filter BSE detectors, El-Mul part of Exosens has a vast experience in turning proprietary and generic technologies into fit-for-purpose, engineered modules suitable for a variety of imaging applications.

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Full range for detection platforms for SEM, STEM and FIB
Segmentation, energy filtering, dual-mode and other technologies available
Tailor-design to meet system specifications and optimize performance

Analytical Electron Microscopy Detectors

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Description

From traditional Everhart-Thornley detectors, through a selection of solid-state detectors and culminating with complex in-column, energy filter BSE detectors, El-Mul part of Exosens has a vast experience in turning proprietary and generic technologies into fit-for-purpose, engineered modules suitable for a variety of imaging applications.

Our offering includes the design and development of novel detectors as well as built-to-print manufacturing, supporting SEM, FIB and STEM systems. Technology platforms such as segmented detection, multi-mode ion/electron detection and others are implemented in detector design to provide “tailor-made” solutions for equipment manufacturers.

PMT modules are also offered and complement the “in vacuum” modules either as a separate module or as an integrated product.

Building on our ScintiFast™ technology, a fast detection technology platform which can support scan rates up to 1nsec/pixel is also available.

Documentation

Brochure/Leaflet